The phenomenon of fake resolution

June 5, 2023 | Andreas Deresch, Gina Naujokat

By chance, we recently encountered a phenomenon together with a customer that we had not paid attention to before. An apparently resolved X-ray image turned out to be a fake. A simulation model proved the mystery.

Our customer showed us an X-ray image of a JIMA resolution structure at 0.4 µm line width.

JIMA resolution structures are among the best-known image quality indicators (IQIs) for checking the resolution of image chains including microfocus X-ray sources in use. The smallest segment of 0.4 µm is used in corresponding microfocus applications with focal spots of less than 0.7 µm full peak width at half-height*. The structure consists of six lines of 0.4 µm each**, seven spaces of 0.4 µm and a wider frame.

 

The apparently well-resolved X-ray image perplexed us with its unexpectedly blurred frame of the structure.

Jima-fig_1
JIMA-chart

 

 

 

This prompted us to do some experiments. For comparison, we took scans of three different structures of the corresponding JIMA test specimen and created a profile of the marked area in each case.

At 0.7 µm, we obtain a resolved image with the chosen focal spot in which the line structure is clearly visible, and also the profile shows six lines.

Jima-fig_2
Jima-fig_3a

At 0.6 µm, all six lines are also imaged, although the noise has already clearly increased.

Jima-fig_4
Jima-fig_5b

Even at 0.4 µm, we obtain a resolved image by subsequent image processing (increasing the contrast, which, however, also increases the noise), showing all lines clearly in the profile, too.

Jima-fig_6
Jima-fig_7

But our input image shows only five instead of six lines in the profile. It must be considered unresolved because the image information merges, and a distorted structure is depicted.

Jima-fig_8
Jima-fig_9b

Using simulation software, we recreate this phenomenon with a simulated, uniformly bright, circular focal spot of 1.7 µm in diameter and obtain the same result.

Jima-fig_10
Jima-fig_11

We are now interested in how different focal spot sizes, each given here as the diameter of a uniformly bright circular disk, behave for the 0.4 µm structure and focus on the number of lines identified. In 0.1-µm steps, everything runs smoothly up to 1.0 µm.

0.1 µm focal spot – 6 lines:

Jima-fig_12
Jima-fig_13

0.6 µm focal spot – 6 lines:

Jima-fig_14
Jima-fig_15

0.8 µm focal spot – 6 lines:

Jima-fig_16
Jima-fig_17

1.0 µm focal spot – 6 lines:

Jima-fig_18
Jima-fig_19

1.1 µm focal spot – NO SINGLE LINE VISIBLE!

Jima-fig_20
Jima-fig_21

1.2 µm focal spot – ONLY 5 LINES VISIBLE!

Jima-fig_22
Jima-fig_23

Remaining 5 lines up to the focal spot of 1.7 µm until a weak visibility at 1.8 µm:

Jima-fig_24
Jima-fig_25

At 1.9 µm focal spot, again, no lines can be seen anymore:

Jima-fig_26
Jima-fig_27

At 2.0 µm only 4 (weak) lines appear,

Jima-fig_28
Jima-fig_29

which are then very clear at 2.1 µm:

Jima-fig_30
Jima-fig_31

We were able to reproduce this process until only three lines were visible at 2.8 µm,

Jima-fig_32
Jima-fig_33

which then became clearer again. As a reminder: The JIMA structure contains 6 lines! All other representations do not correspond to reality.

 

This phenomenon therefore seems to be obviously dependent on the shape / size of the focal spot used and could be numerically reproduced on the basis of the simulation model.

Jima-fig_34

Looking at the modulation transfer function (MTF) for an image with the simulated focal spot, one can see several spatial frequencies, corresponding to different line widths of the resolution patterns, at which the curve reaches the zero line, i.e. the image would show no contrast at all. The areas between two such points correspond to the visibility of a reduced number of lines. Only in the range up to the first(!) falling below a selected threshold value the corresponding structure size can be considered as resolved. A common threshold value oriented to human perception is 10%.

With this simulation we wanted to illustrate that apparently resolved images of a test specimen do not necessarily always show what is present. In the case of using the different JIMA test specimens, it is highly recommended to verify the actual presence of all lines of the structure. Comet Yxlon offers in its CT systems an operator support software integrated in Geminy, which prevents misinterpretation and always ensures what resolutions can actually be achieved! You can see an example of a resolution test report below. Just contact us.

Jima-fig_35

* The determination of focal spot sizes in this size range has not yet been standardized. As part of the NanoXSpot funding project, two methods were further developed with the participation of Comet Yxlon and proposed for standardization.

** Nominal. There is a tolerance of ±10% at 23°C. An accompanying certificate contains the actual sizes measured at final acceptance.

Latest three news

Looking through the glass: X-ray Inspection of Through-Glass Vias (TGV) for Advanced Packaging

June 22, 2026 | Dr. Daniel Stickler

Glass is attracting increasing attention as a substrate material for advanced semiconductor packaging. Its dimensional stability and electrical properties make it an interesting basis for large-area panels and high-density interconnect structures. But when electrical connections are routed through the glass using through-glass vias (TGVs), a new inspection challenge emerges: many of the relevant defects are no longer visible from the surface. At Photomask Japan 2026, we presented our first imaging examples for glass substrates and TGV structures. The results show how X-ray imaging can provide non-destructive access to defects in etched glass vias and metallized TGVs — and why tilted radiography, computed laminography, detector performance, and AI-assisted analysis all matter.

Read more

Using CT to unearth new discoveries in Schleswig Holstein’s Duvenseer Moor.

June 8, 2026

Earlier this year, we had the chance to collaborate with the Fraunhofer Research Institution for Individualized Medical Technology and Engineering IMTE (Fraunhofer IMTE) and the Leibniz Centre for Archaeology (LEIZA) on a unique find within an Aurochs skull unearthed at the oldest known grave in northern Germany – The Duvenseer Moor in Schleswig Holstein.

Read more

A 9th-Grade Internship, a CT Scan, and an AI That Learned to Tell Sugar from Salt

February 12, 2026 | Dr. Daniel Stickler

During a recent three-week student internship at Comet Yxlon, I had the chance to mentor a 9th-grader who was curious, motivated—and (for good reasons) not allowed to operate X-ray equipment independently. So we designed a project that would still feel real: hands-on data, real analysis, and a clear outcome. The goal was to let her work independently in software while learning the basics of X-ray imaging and computed tomography.

Read more